Title :
Hysteresis modeling of thin permalloy films and parameter interpretation
Author :
Haumer, Peter ; Hauser, Hans ; Fulmek, Paul L. ; Bajalan, Diyar
Author_Institution :
Vienna Univ. of Technol., Austria
fDate :
7/1/2004 12:00:00 AM
Abstract :
An energetic model is used to calculate macroscopic magnetization behavior of thin Permalloy films. Therefore it is extended by magnetocrystalline anisotropy energy and domain classes that particularly represent magnetization rotation. Some model parameters can be related to coherent rotation of domain magnetizations. A qualitative agreement is achieved with measurements on sputtered Permalloy films used for anisotropic magnetoresistance (AMR) sensors.
Keywords :
Permalloy; anisotropic media; magnetic anisotropy; magnetic hysteresis; magnetic thin films; magnetoresistance; anisotropic magnetoresistance sensors; anisotropic media; energetic model; hysteresis modeling; macroscopic magnetization behavior; magnetic hysteresis; magnetization rotation; magnetocrystalline anisotropy energy; parameter interpretation; thin permalloy films; Anisotropic magnetoresistance; Demagnetization; Magnetic anisotropy; Magnetic domains; Magnetic films; Magnetic hysteresis; Magnetic sensors; Magnetization; Perpendicular magnetic anisotropy; Substrates; Anisotropic media; magnetic hysteresis; magnetization; magnetoresistance; permalloy films;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2004.832283
