DocumentCode
1077530
Title
Extended X-ray absorption fine structure analysis of cation distribution in MnFe2O4 single crystal films and artificial ferrite structures
Author
Yang, Aria ; Harris, Vincent G. ; Calvin, Scott ; Zuo, Xu ; Vittor, Carmine
Author_Institution
Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
Volume
40
Issue
4
fYear
2004
fDate
7/1/2004 12:00:00 AM
Firstpage
2802
Lastpage
2804
Abstract
The cation distribution in MnFe2O4 single crystal films and artificial ferrite structures is determined by a multiple-edge analysis of the extended X-ray absorption fine structure (EXAFS) of the manganese and iron absorption edges. Compared with conventional manganese ferrite films processed by pulsed laser ablation (PLD), artificial ferrites that are constructed by a unique layer-by-layer PLD deposition were found to have inversion parameters as high as 58%. Magnetic properties of these ferrite films are compared as a function of cation inversion.
Keywords
X-ray absorption; epitaxial layers; ferrites; iron compounds; magnetic particles; manganese compounds; positive ions; pulsed laser deposition; MnFe2O4; absorption edges; artificial ferrite structures; cation distribution; cation inversion; crystal films; extended X-ray absorption fine structure; fine structure analysis; inversion parameters; layer-by-layer PLD deposition; manganese ferrite films; pulsed laser ablation; spinel ferrite; Electromagnetic wave absorption; Ferrite films; Iron; Laser ablation; Magnetic analysis; Magnetic properties; Manganese; Optical pulses; Pulsed laser deposition; X-ray lasers; Artificial film; EXAFS; extended X-ray absorption fine structure; laser ablation deposition; spinel ferrite;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2004.832246
Filename
1325647
Link To Document