DocumentCode
1077539
Title
MNOS/CCD nonvolatile analog memory
Author
Withers, R.S. ; Silversmith, D.J. ; Mountain, R.W.
Author_Institution
Massachusetts Institute of Technology, Lexington, MA
Volume
2
Issue
7
fYear
1981
fDate
7/1/1981 12:00:00 AM
Firstpage
165
Lastpage
166
Abstract
MNOS storage sites have been integrated with an n-channel CCD to produce a nonvolatile memory capable of storing sampled analog signals. Analog signals, sampled at the CCD input, are stored as trapped charge in the MNOS dielectric and may be replicated nondestructively after four days of storage with a linear dynamic range of 33 dB.
Keywords
Analog memory; Charge coupled devices; Clocks; Dynamic range; Fabrication; Nonvolatile memory; Silicon; Tunneling; Voltage; Writing;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1981.25384
Filename
1481868
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