• DocumentCode
    1077766
  • Title

    Bayesian reliability estimation based on a weibull stress-strength model for aged power system components subjected to voltage surges

  • Author

    Chiodo, Elio ; Mazzanti, G.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Napoli
  • Volume
    13
  • Issue
    4
  • fYear
    2006
  • Firstpage
    935
  • Lastpage
    937
  • Abstract
    For original article by E. Chiodo, G. Mazzanti, see ibid., vol.13, no.1, p.146-59, February 2006
  • Keywords
    Bayes methods; Weibull distribution; ageing; power system reliability; surges; Bayesian reliability estimation; Weibull stress-strength model; ageing; power system components; voltage surges; Aging; Bayesian methods; Distribution functions; Integral equations; Power system modeling; Power system reliability; Radio frequency; Stress; Surges; Voltage;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2006.1667755
  • Filename
    1667755
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1077766