DocumentCode :
1077944
Title :
Current transport in modulation doped (Al,Ga)As/GaAs heterostructures: Applications to high speed FET´s
Author :
Morkoç, H.
Author_Institution :
University of Illinois, Urbana, IL
Volume :
2
Issue :
10
fYear :
1981
fDate :
10/1/1981 12:00:00 AM
Firstpage :
260
Lastpage :
262
Abstract :
Current voltage characteristics of single period modulation doped (Al,Ga) As/GaAs heterostructures are reported. The measurements were performed in a lattice temperature range of 10-300 K and up to an electric field of 2 kV/cm. While no nonlinearity was observed at 300 K, a substantial nonlinearity was encountered at lattice temperatures below 170 K. Compared to bulk GaAs FET´s, the results indicate that a speed performance improvement of 60% at 300 K and four times at 78 K can be obtained in modulation doped FET´s operating at a field strength of 2 kV/cm. Modulation doped GaAs/n- (Al,Ga) As FET´s with 1 µm gate lengths exhibited a gain of 12 dB at 10 GHz. This represents the best result reported to date.
Keywords :
Current-voltage characteristics; Electric variables measurement; Electron mobility; Epitaxial layers; FETs; Gallium arsenide; Hall effect; Lattices; Temperature; Voltage;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1981.25425
Filename :
1481909
Link To Document :
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