Title : 
Current transport in modulation doped (Al,Ga)As/GaAs heterostructures: Applications to high speed FET´s
         
        
        
            Author_Institution : 
University of Illinois, Urbana, IL
         
        
        
        
        
            fDate : 
10/1/1981 12:00:00 AM
         
        
        
        
            Abstract : 
Current voltage characteristics of single period modulation doped (Al,Ga) As/GaAs heterostructures are reported. The measurements were performed in a lattice temperature range of 10-300 K and up to an electric field of 2 kV/cm. While no nonlinearity was observed at 300 K, a substantial nonlinearity was encountered at lattice temperatures below 170 K. Compared to bulk GaAs FET´s, the results indicate that a speed performance improvement of 60% at 300 K and four times at 78 K can be obtained in modulation doped FET´s operating at a field strength of 2 kV/cm. Modulation doped GaAs/n- (Al,Ga) As FET´s with 1 µm gate lengths exhibited a gain of 12 dB at 10 GHz. This represents the best result reported to date.
         
        
            Keywords : 
Current-voltage characteristics; Electric variables measurement; Electron mobility; Epitaxial layers; FETs; Gallium arsenide; Hall effect; Lattices; Temperature; Voltage;
         
        
        
            Journal_Title : 
Electron Device Letters, IEEE
         
        
        
        
        
            DOI : 
10.1109/EDL.1981.25425