DocumentCode :
1078177
Title :
Architecture of a Slow-Control ASIC for Future High-Energy Physics Experiments at SLHC
Author :
Gabrielli, A. ; De Robertis, G. ; Fiore, D. ; Loddo, F. ; Ranieri, A.
Author_Institution :
Phys. Dept., Univ. of Bologna, Bologna
Volume :
56
Issue :
3
fYear :
2009
fDate :
6/1/2009 12:00:00 AM
Firstpage :
1163
Lastpage :
1167
Abstract :
This work is aimed at defining the architecture of a new digital ASIC, namely slow control logic (SCL), which will be designed and fabricated in a commercial 130 nm CMOS technology. This chip will be embedded within a high-speed data acquisition optical link (GBT) to control and monitor the front-end electronics proposed for future high-energy physics experiments at the super-Large Hadron Collider (SLHC), CERN, Geneva. The GBT link provides a transparent transport layer between the SCL and control electronics in the counting room. It will be provided with rad-hard redundant logic for critical circuits. The project follows a set of designs that were recently developed via a 250 nm CMOS technology for LHC experiments. Since this 250 nm specific technology used to design ASICs for the LHC will no longer be available as it was in the past, requesting an update technology for future experiments must be satisfied in any case. A test chip that implements three different redundant methodologies against single event effects is also described.
Keywords :
CMOS integrated circuits; application specific integrated circuits; data acquisition; nuclear electronics; optical links; ASIC; CERN; CMOS technology; SLHC; control electronics; data acquisition optical link; front-end electronics; high-energy physics; single event effects; size 130 nm; size 250 nm; slow control logic; Application specific integrated circuits; CMOS logic circuits; CMOS technology; Data acquisition; Large Hadron Collider; Logic design; Monitoring; Optical control; Optical fiber communication; Physics; GBT; SCL; radiation hardness; single event effects;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2008.2009937
Filename :
5075935
Link To Document :
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