• DocumentCode
    1078210
  • Title

    The Aging Process in Electrical Insulation: A Tutorial Summary

  • Author

    G. Alleb, Peter H. ; Tustin, Arnold

  • Author_Institution
    Department of Electrical Engineering, Imperial College of Science and Technology, London, England
  • Issue
    3
  • fYear
    1972
  • Firstpage
    153
  • Lastpage
    157
  • Abstract
    Calculating the life expectancy of electrical insulation is an interesting application of Arrhenius´s law. Bussing´s analytical treatment is derived for the simple case of life at constant temperature. Its extension to variable temperature conditions is explained as is the application of the same techniques to calculating mechanical failure due to creep and capacitor failure due to electrode diffusion. Lastly, recently developed techniques for rapid determination of the slopes of Arrhenius´s-law graphs for insulation life are reviewed.
  • Keywords
    Aging; Capacitors; Chemical processes; Creep; Dielectrics and electrical insulation; Electrical engineering; Electrodes; Insulation life; Temperature dependence; Tutorial;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/TEI.1972.299199
  • Filename
    4081713