Title :
Development of Picosecond-Resolution Large-Area Time-of-Flight Systems
Author :
Ertley, Camden ; Anderson, John ; Byrum, Karen ; Drake, Gary ; Frisch, Henry ; Genat, Jean-Francois ; Sanders, Harold ; Tang, Fukun
Author_Institution :
Enrico Fermi Inst., Univ. of Chicago, Chicago, IL
fDate :
6/1/2009 12:00:00 AM
Abstract :
The measurement of time-of-flight (TOF) of relativistic particles in high-energy colliders with picosecond resolution would qualitatively change the ability to identify underlying parton-level processes at future colliders or upgrades of existing detectors. We have measured the timing properties of three micro-channel plate photo-multiplier tubes (MCPPMTs) from Photonis; one with 1024 anodes and the other two with 64 anodes. The 1024-anode 10-micron pore tube uses a charge-collection scheme at the anode to provide equal arrival time of the signal independent of the hit position of incident light on the face of the tube. The two 64-anode 25-micron pore tubes have a commercially available collection scheme and were used to find a limit on the timing resolution. We have performed these measurements using a newly assembled test-stand based on a Hamamatsu PLP-10 picosecond laser and a commercial CAMAC readout electronics system. We present these results and compare timing properties to earlier versions of the charge collection scheme.
Keywords :
anodes; high-speed optical techniques; photomultipliers; position sensitive particle detectors; readout electronics; timing jitter; CAMAC readout electronics; Hamamatsu PLP-10 picosecond laser; Photonis; anodes; charge-collection scheme; high-energy colliders; microchannel plate photomultiplier tubes; parton-level processes; pore tube; relativistic particles; size 10 mum; size 25 mum; time-of-flight systems; timing; Anodes; Assembly systems; CAMAC; Detectors; Electronic equipment testing; Particle measurements; Performance evaluation; Signal resolution; System testing; Timing; Cherenkov radiation; micro-channel plates; photo detectors; photomultipliers; time-of-flight; timing jitter;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2009.2016422