• DocumentCode
    1078550
  • Title

    A three-dimensional analysis of semiconductor devices

  • Author

    Yoshii, Akira ; Kitazawa, Hitoshi ; Tomizawa, Masaaki ; Horiguchi, Shoji ; Sudo, Tsuneta

  • Author_Institution
    Nippon Telegraph and Telephone Public Corporation, Tokyo, Japan
  • Volume
    29
  • Issue
    2
  • fYear
    1982
  • fDate
    2/1/1982 12:00:00 AM
  • Firstpage
    184
  • Lastpage
    189
  • Abstract
    An accurate three-dimensional analysis of semiconductor devices based on the general transport equations is carried out. In this analysis, the finite difference formulation and ICCG (Incomplete Choleski and Conjugate Gradient) methods are utilized to reduce computational time and memory requirements. The algorithms are applied to a wide variety of devices, including a bipolar n-p-n transistor, an Integrated Injection Logic (ILL), and a Static Induction Transistor (SIT). Calculated results are compared to those obtained using a conventional two-dimensional simulator. Several three-dimensional effects are modeled successfully. These analyses make it clear that three-dimensional calculation is indispensable for accurate device modeling.
  • Keywords
    Bipolar transistors; Differential equations; Finite difference methods; MOSFETs; Mathematical model; Nonlinear equations; Partial differential equations; Poisson equations; Semiconductor devices; Semiconductor process modeling;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1982.20681
  • Filename
    1482178