Title :
A wafer-level hermetic encapsulation for MEMS manufacture application
Author :
Liang, Zhi-Hao ; Cheng, Yu-Ting ; Hsu, Wensyang ; Lee, Yuh-Wen
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu
Abstract :
In order to simplify the processing complexity and cut down the manufacturing cost, a new wafer bonding technique using ultraviolet (UV) curable adhesive is introduced here for microelectromechanical systems (MEMS) device packaging and manufacturing applications. UV curable adhesive is cured through UV light exposure without any heating process that is suitable for the packaging of temperature-sensitive materials or devices. A Pyrex 7740 glass is chemically wet etched to form microcavities and utilized as the protection cap substrate. After a UV-curable adhesive is spin-coated onto the glass substrate, the substrate is then aligned and bonded through UV light exposure with a device substrate below. Electrical contact pad opening and die separation are done simultaneously by dicing. Two different testing devices, a dew point sensor and capacitive accelerometer, are built to evaluate the package strength and hermeticity. After the dicing process, no structural damage or stiction phenomenon is found in the packaged parallel capacitor. The acceleration test results also indicate that the package using the Loctite 3491 UV adhesive with 150 mum bond width can survive more than 300 days at a 25degC and 100% relative humidity working environment
Keywords :
adhesive bonding; electron device manufacture; electronics packaging; encapsulation; hermetic seals; microassembling; micromechanical devices; 150 micron; 25 C; Loctite 3491 UV adhesive; MEMS manufacture; Pyrex 7740; acceleration tests; capacitive accelerometer; chemically wet etching; device packaging; dew point sensor; dicing process; die separation; driven-out spin method; electrical contact pad opening; hermetic encapsulation; low-temperature wafer bonding; microelectromechanical systems; ultraviolet curable adhesive; wafer-level packaging; Costs; Encapsulation; Glass; Manufacturing processes; Microelectromechanical systems; Micromechanical devices; Packaging; Testing; Wafer bonding; Wafer scale integration; Acceleration tests; driven-out spin method; hermetic encapsulation; low-temperature wafer bonding; microelectromechanical systems (MEMS) manufacturing; post-process; ultraviolet (UV) adhesive; wafer-level packaging;
Journal_Title :
Advanced Packaging, IEEE Transactions on
DOI :
10.1109/TADVP.2006.875092