DocumentCode :
1078600
Title :
Crystal Growth and Scintillation Properties of Strontium Iodide Scintillators
Author :
van Loef, Edgar V. ; Wilson, Cody M. ; Cherepy, Nerine J. ; Hull, Guilia ; Payne, Stephen A. ; Choong, Woon-Seng ; Moses, William W. ; Shah, Kanai S.
Author_Institution :
Radiat. Monitoring Devices, Inc., Watertown, MA
Volume :
56
Issue :
3
fYear :
2009
fDate :
6/1/2009 12:00:00 AM
Firstpage :
869
Lastpage :
872
Abstract :
Single crystals of SrI2:Eu and SrI2:Ce/Na were grown from anhydrous iodides by the vertical Bridgman technique in evacuated silica ampoules. Growth rates were of the order of 5-30 mm/day. Radioluminescence spectra of SrI2:Eu and SrI2:Ce/Na exhibit a broad band due to Eu2+ and Ce3+ emission, respectively. The maximum in the luminescence spectrum of SrI2:Eu is found at 435 nm. The spectrum of SrI2:Ce/Na exhibits a doublet peaking at 404 and 435 nm attributed to Ce3+ emission, while additional impurity-or defect-related emission is present at approximately 525 nm. The strontium iodide scintillators show very high light yields of up to 120 000 photons/MeV, have energy resolutions down to 3% at 662 keV (Full Width Half Maximum) and exhibit excellent light yield proportionality with a standard deviation of less than 5% between 6 and 460 keV.
Keywords :
cerium; crystal growth from melt; doping profiles; europium; luminescence; sodium; solid scintillation detectors; strontium compounds; SrI2:Ce; SrI2:Eu; SrI2:Na; anhydrous iodide; crystal growth; energy resolution; evacuated silica ampoules; luminescence spectrum; radioluminescence spectra; scintillation properties; strontium iodide scintillators; vertical Bridgman technique; wavelength 404 nm; wavelength 435 nm; Crystalline materials; Crystals; Energy resolution; Heating; Laboratories; Luminescence; Moisture; Silicon compounds; Solid scintillation detectors; Strontium; Alkaline-earth halides; crystal growth; energy resolution; scintillation detectors;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2009.2013947
Filename :
5075976
Link To Document :
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