Title :
Dielectric Breakdown in Perspex
Author_Institution :
Electrical Engineering Department, University of Canterbury, Christchureh, New Zealand
Abstract :
Experiments have been carried out to investigate the breakdown mechanism in Perspex over a temperature range from 20 to 160°C, using impulse voltages of widely differing rise times. The electric strength was found to be sensitive to voltage rise time, reaching a maximum as the rise time is increased, but falling again at longer rise times towards the dc value. The results are discussed in terms of a model in which space charges accumulate at the electrodes, positive charges at the anode, and negative charges at the cathode.
Keywords :
Breakdown voltage; Dielectric breakdown; Electric breakdown; Electrodes; Electron traps; Polymers; Solids; Temperature dependence; Temperature distribution; Thermal conductivity;
Journal_Title :
Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TEI.1973.299247
