DocumentCode :
1078997
Title :
Computer modeling of diode forward recovery characteristics
Author :
Root, C. David ; Melillo, J. ; Sammon, S.
Author_Institution :
Raytheon Company, Sudbury, MA
Volume :
29
Issue :
3
fYear :
1982
fDate :
3/1/1982 12:00:00 AM
Firstpage :
461
Lastpage :
463
Abstract :
Ebers-Moll based computer models for diodes cannot accurately represent forward recovery characteristics. This occurs because the model is basically a modified RC network, while the forward recovery behavior is essentially inductive. The situation may be corrected using an Ebers-Moll modeled transistor, which shunts a resistor in series with the diode. The transistor is initially off, so there is a large voltage drop across the resistor. When the transistor turns on, the voltage drop is limited by the saturation voltage of the transistor. When properly modeled, excellent agreement with experimental data was found, and no detrimental effects on other simulated diode characteristics resulted.
Keywords :
Capacitance; Circuit testing; Computational modeling; Computer simulation; Diodes; Equations; Impedance; Pulse modulation; Resistors; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1982.20724
Filename :
1482221
Link To Document :
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