• DocumentCode
    1079260
  • Title

    A bulk current injection test conforming to statistical properties of radiation-induced effects

  • Author

    Spadacini, Giordano ; Pignari, Sergio A.

  • Author_Institution
    Dept. of Electr. Eng., Politecnico di Milano, Italy
  • Volume
    46
  • Issue
    3
  • fYear
    2004
  • Firstpage
    446
  • Lastpage
    458
  • Abstract
    In this paper, a bulk current injection (BCI) immunity test is designed that conforms to the effects induced in the equipment under test (EUT) by a radiated electromagnetic disturbance (EMD). This is done by adopting a statistical description of the EMD and by comparing currents induced by BCI and distributed field-coupling (i.e., radiation) in the input pins of the EUT. Closed-form results are obtained that enforce equivalence of the aforementioned test procedures in terms of specific statistical estimates (e.g., expected value and dispersion) as well as for worst-case radiation-induced effects. A distributed-parameter circuit model of the system under test is adopted, composed by the EUT, auxiliary equipment (AE), and a wiring harness. In the analysis, the EMD is described via plane waves with random parameters and a uniform multiconductor transmission line model is used for the wiring harness. The EUT and AE are represented via lumped impedance matrices. Injection-probe feeding-conditions assuring equivalence are derived analytically, and involve a frequency piecewise-linear profile of the RF voltage source. The proposed BCI immunity test overcomes practical-design difficulties of previous formulations.
  • Keywords
    electromagnetic compatibility; electromagnetic interference; immunity testing; multiconductor transmission lines; statistics; RF voltage source; auxiliary equipment; bulk current injection immunity test; distributed field-coupling; distributed-parameter circuit model; electromagnetic compatibility; electromagnetic interference; equipment under test; frequency piecewise-linear profile; injection-probe feeding condition; lumped impedance matrix; plane wave; radiated electromagnetic disturbance; radiation-induced effect; statistical property; uniform multiconductor transmission line model; wiring harness; Circuit testing; Dispersion; Distributed parameter circuits; Electromagnetic radiation; Impedance; Multiconductor transmission lines; Pins; System testing; Transmission line matrix methods; Wiring; Bulk current injection; conducted susceptibility; multiconductor transmission lines; radiated susceptibility; statistical EMC models;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2004.831896
  • Filename
    1325800