Title :
Smart-substrate multichip-module systems
Author :
Maly, Wojciech ; Feltham, Derek B I ; Gattiker, Anne E. ; Hobaugh, Mark D. ; Backus, Enneth ; Thomas, Michael E.
Author_Institution :
Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
This implementation strategy enables incremental test of all system components, providing an alternative solution to the known good die testing problem. The authors present a simple microcontroller emulator designed and fabricated for study of the test logic needed as a key component of this method.<>
Keywords :
logic design; logic testing; multichip modules; incremental test; microcontroller emulator; multichip-module systems; smart-substrate; test logic; Circuit testing; Conductors; Costs; Manufacturing; Multichip modules; Packaging; Power generation economics; Prototypes; System performance; System testing;
Journal_Title :
Design & Test of Computers, IEEE
