Title :
Effect of screening tests on the lifetime statistics of injection lasers
Author :
Lynch, Robert T., Jr.
Author_Institution :
Almaden Research Center, San Jose, CA, USA
fDate :
11/1/1980 12:00:00 AM
Abstract :
Injection laser lifetime data are subjected to a simple screening test to identify the longer lived units. The effect this has on the lifetime distribution, and in particular, on the reliability of a system composed of a set of these lasers is considered.
Keywords :
Life estimation; Semiconductor device reliability; Semiconductor lasers; Aging; Life testing; Light sources; Power generation; Power lasers; Redundancy; Reliability; Semiconductor lasers; Statistical analysis; Statistical distributions;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1980.1070379
