• DocumentCode
    1080496
  • Title

    Feed forward due to barrier modulation in charge-coupled devices

  • Author

    Madan, Sudhir K. ; Mathur, Bimal ; Vasi, J.

  • Author_Institution
    Indian Institute of Technology, Delhi, India
  • Volume
    29
  • Issue
    8
  • fYear
    1982
  • fDate
    8/1/1982 12:00:00 AM
  • Firstpage
    1269
  • Lastpage
    1276
  • Abstract
    A new type of signal degradation, namely feed forward, is shown to exist in charge-coupled devices. This arises because of barrier modulation due to signal charge and the presence of surface states. Feed forward results in a pulse coming out earlier than the main signal pulse. The magnitude of the feed forward pulse was found to be as high as 0.5 percent of the signal charge for a 24½ bit, CCD delay line. Computer calculations have been performed to quantify the effect for the structure. Results obtained with a special clock for different clocking parameters have been explained, based on the existing model of emission of charge from the surface states.
  • Keywords
    Charge coupled devices; Charge transfer; Clocks; Degradation; Delay lines; Digital integrated circuits; Feeds; Integrated circuit technology; Interface states; Physics;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1982.20866
  • Filename
    1482363