DocumentCode
1080627
Title
New measurement technique for waveguide losses based on photoluminescence
Author
Amersfoort, M.R. ; Grutzmacher, D. ; Smit, Meint K. ; Oei, Y.S.
Author_Institution
Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
Volume
27
Issue
13
fYear
1991
fDate
6/20/1991 12:00:00 AM
Firstpage
1152
Lastpage
1153
Abstract
A new technique has been developed to measure optical losses of waveguide devices fabricated in III-V semiconductors by optical excitation of an integrated twinguide structure, which is nondestructive and also applicable to multimode waveguides and multiport waveguide devices. Reproducibility of excitation was found to be better than 0.2 dB.
Keywords
integrated optics; integrated optoelectronics; nondestructive testing; optical loss measurement; optical waveguide components; optical waveguides; III-V semiconductors; OEIC; integrated twinguide structure; measurement technique; multimode waveguides; multiport waveguide devices; optical excitation; optical losses; photoluminescence; waveguide losses;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19910718
Filename
132720
Link To Document