Title :
New measurement technique for waveguide losses based on photoluminescence
Author :
Amersfoort, M.R. ; Grutzmacher, D. ; Smit, Meint K. ; Oei, Y.S.
Author_Institution :
Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
fDate :
6/20/1991 12:00:00 AM
Abstract :
A new technique has been developed to measure optical losses of waveguide devices fabricated in III-V semiconductors by optical excitation of an integrated twinguide structure, which is nondestructive and also applicable to multimode waveguides and multiport waveguide devices. Reproducibility of excitation was found to be better than 0.2 dB.
Keywords :
integrated optics; integrated optoelectronics; nondestructive testing; optical loss measurement; optical waveguide components; optical waveguides; III-V semiconductors; OEIC; integrated twinguide structure; measurement technique; multimode waveguides; multiport waveguide devices; optical excitation; optical losses; photoluminescence; waveguide losses;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19910718
