• DocumentCode
    1080671
  • Title

    Band-structure engineering in strained semiconductor lasers

  • Author

    O´Reilly, Eoin P. ; Adams, Alfred R.

  • Author_Institution
    Fraunhofer-Inst. IAF, Freiburg, Germany
  • Volume
    30
  • Issue
    2
  • fYear
    1994
  • fDate
    2/1/1994 12:00:00 AM
  • Firstpage
    366
  • Lastpage
    379
  • Abstract
    The influence of both compressive and tensile strain on semiconductor lasers and optical amplifiers is reevaluated in the light of recent experimental and theoretical work. Strain reduces the three-dimensional symmetry of the lattice and helps match the wave functions of the holes to the one-dimensional symmetry of the laser beam. It can also decrease the density of states at the valence band maximum and so reduce the carrier density required to reach threshold. These two effects appear to adequately explain the TE and TM gain in compressive and tensile structures, including polarization-independent amplifiers, the behavior of visible lasers and the improved frequency characteristics of InGaAs/GaAs lasers. In 1.5 μm InGaAsP/InP lasers phonon-assisted Auger recombination appears to remain the dominant current path and can explain why the temperature sensitivity parameter to remains <100 K at room temperature
  • Keywords
    Auger effect; band structure of crystalline semiconductors and insulators; carrier density; electron-hole recombination; laser theory; semiconductor lasers; valence bands; InGaAs/GaAs lasers; InGaAsP/InP lasers; TE gain; TM gain; band-structure engineering; carrier density; compressive strain; density of states; dominant current path; frequency characteristics; laser beam; lattice; phonon-assisted Auger recombination; polarization-independent amplifiers; semiconductor optical amplifiers; strained semiconductor lasers; tensile strain; three-dimensional symmetry; threshold; valence band maximum; visible lasers; wave functions; Capacitive sensors; Laser theory; Lattices; Optical sensors; Semiconductor lasers; Semiconductor optical amplifiers; Stimulated emission; Temperature sensors; Tensile strain; Wave functions;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.283784
  • Filename
    283784