DocumentCode :
1080671
Title :
Band-structure engineering in strained semiconductor lasers
Author :
O´Reilly, Eoin P. ; Adams, Alfred R.
Author_Institution :
Fraunhofer-Inst. IAF, Freiburg, Germany
Volume :
30
Issue :
2
fYear :
1994
fDate :
2/1/1994 12:00:00 AM
Firstpage :
366
Lastpage :
379
Abstract :
The influence of both compressive and tensile strain on semiconductor lasers and optical amplifiers is reevaluated in the light of recent experimental and theoretical work. Strain reduces the three-dimensional symmetry of the lattice and helps match the wave functions of the holes to the one-dimensional symmetry of the laser beam. It can also decrease the density of states at the valence band maximum and so reduce the carrier density required to reach threshold. These two effects appear to adequately explain the TE and TM gain in compressive and tensile structures, including polarization-independent amplifiers, the behavior of visible lasers and the improved frequency characteristics of InGaAs/GaAs lasers. In 1.5 μm InGaAsP/InP lasers phonon-assisted Auger recombination appears to remain the dominant current path and can explain why the temperature sensitivity parameter to remains <100 K at room temperature
Keywords :
Auger effect; band structure of crystalline semiconductors and insulators; carrier density; electron-hole recombination; laser theory; semiconductor lasers; valence bands; InGaAs/GaAs lasers; InGaAsP/InP lasers; TE gain; TM gain; band-structure engineering; carrier density; compressive strain; density of states; dominant current path; frequency characteristics; laser beam; lattice; phonon-assisted Auger recombination; polarization-independent amplifiers; semiconductor optical amplifiers; strained semiconductor lasers; tensile strain; three-dimensional symmetry; threshold; valence band maximum; visible lasers; wave functions; Capacitive sensors; Laser theory; Lattices; Optical sensors; Semiconductor lasers; Semiconductor optical amplifiers; Stimulated emission; Temperature sensors; Tensile strain; Wave functions;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.283784
Filename :
283784
Link To Document :
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