• DocumentCode
    1081136
  • Title

    Phosphor-Free GaN-Based Transverse Junction White-Light Light-Emitting Diodes With Regrown n-Type Regions

  • Author

    Shi, J.-W. ; Chen, C.-C. ; Wang, C.-K. ; Lin, C.-S. ; Sheu, J.-K. ; Lai, W.-C. ; Kuo, C.-H. ; Tun, C.-J. ; Yang, T.-H. ; Tsao, F.-C. ; Chyi, J.-I.

  • Author_Institution
    Nat. Central Univ., Taoyuan
  • Volume
    20
  • Issue
    6
  • fYear
    2008
  • fDate
    3/15/2008 12:00:00 AM
  • Firstpage
    449
  • Lastpage
    451
  • Abstract
    In this study, we demonstrate a GaN-based phosphor-free white-light light-emitting diode (LED), which is composed of GaN-based dual-wavelength (blue and yellow-green) multiple-quantum-wells (MQWs) and a transverse p-n junction. The device was realized by the regrowth of n-type GaN layers on the sidewall of p-type GaN and undoped MQWs. The problems related to the bias-dependent shape of the electroluminescence spectra that occur in traditional phosphor-free white-light LEDs (with vertical p-n junctions) are greatly minimized. The current-voltage performance of our device is comparable to that of the commercially available phosphor white-light LEDs. In addition, the dynamic measurement results indicate that we can attain a much higher modulation bandwidth (22 versus 3 MHz) with this device than with the currently available commercial ones.
  • Keywords
    III-V semiconductors; electroluminescence; gallium compounds; light emitting diodes; p-n junctions; semiconductor quantum wells; wide band gap semiconductors; GaN; LED; current-voltage performance; dual-wavelength multiple-quantum-wells; electroluminescence spectra; modulation bandwidth; phosphor-free white-light light-emitting diode; transverse p-n junction; Bandwidth; Current measurement; Electroluminescence; Gallium nitride; Light emitting diodes; P-n junctions; Phosphors; Quantum well devices; Shape; Wavelength measurement; GaN light-emitting diodes (LEDs); white-light generation;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2008.916966
  • Filename
    4456733