DocumentCode
1081198
Title
Fluxless and virtually voidless soldering for semiconductor chips
Author
Mizuishi, Ken´Ichi ; Tokuda, Masahide ; Fujita, Yuuji
Author_Institution
Hitachi Ltd., Tokyo, Japan
Volume
11
Issue
4
fYear
1988
Firstpage
447
Lastpage
451
Abstract
A novel soldering technique using a solder washer preform has been developed. A conventional vacuum-release process is used in the soldering procedure. That is, after curing of the assembly in vacuum ( approximately 1 torr) the fused washer preform wets the specimens (e.g. chip and heat sink) to seal up the through-hole area of the washer preform with approximately 1 torr. Subsequently, the vacuum is released to make the fluid pure solder flow into the through-hole area in such a manner that most of the oxide film of the washer preform is destroyed. It is demonstrated that the procedure results in an ideal bond with pure solder in a vacuum, without using flux. It also demonstrated that the above technique can be used to reduce voids to less than 5% on average in solder bonds with 1-cm/sup 2/ chips or 3-in wafers. Improved solder bond strength due to the new technique is also confirmed.<>
Keywords
semiconductor technology; soldering; bond strength; fluxless soldering; ideal bond; pure solder; semiconductor chips; solder washer preform; through-hole area; vacuum-release process; virtually voidless soldering; Assembly; Cooling; Electronic components; Heat sinks; Preforms; Soldering; Thermal conductivity; Thermal management; Thermal resistance; Wafer bonding;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/33.16681
Filename
16681
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