DocumentCode :
1081278
Title :
I-4 submicron VLSI
Author :
Buss, D.
Volume :
29
Issue :
10
fYear :
1982
fDate :
10/1/1982 12:00:00 AM
Firstpage :
1660
Lastpage :
1660
Keywords :
Geometry; Instruments; Laboratories; MOS devices; MOSFET circuits; Paper technology; Silicon; Technology forecasting; Threshold voltage; Very large scale integration;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1982.20938
Filename :
1482435
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1081278
