Title :
A 20-Gb/s Burst-Mode Clock and Data Recovery Circuit Using Injection-Locking Technique
Author :
Lee, Jri ; Liu, Mingchung
Author_Institution :
Nat. Taiwan Univ., Taipei
fDate :
3/1/2008 12:00:00 AM
Abstract :
A 20-Gb/s clock and data recovery circuit incorporates injection-locking technique to achieve high-speed operation with low power dissipation. The circuit creates spectral line at the frequency of data rate and injection-locks two cascaded LC oscillators. A frequency-monitoring mechanism is employed to ensure a close matching between the VCO natural frequency and data rate. Fabricated in 90-nm CMOS technology, this circuit achieves a bit error rate of less than 10-9 in both continuous (PRBS of 231-1) and burst modes while consuming 175 mW from a 1.5-V supply.
Keywords :
CMOS digital integrated circuits; cascade networks; clocks; error statistics; injection locked oscillators; integrated circuit design; optical burst switching; optical fibre networks; phase locked loops; voltage-controlled oscillators; CMOS technology; VCO natural frequency; bit error rate; bit rate 20 Gbit/s; burst mode operation; burst-mode clock; cascaded LC oscillators; data recovery circuit; frequency-monitoring mechanism; high-speed operation; injection-locking technique; low power dissipation; operational amplifier; phase-locked loop; power 175 mW; size 90 nm; spectral lines; voltage 1.5 V; voltage-controlled oscillator; Bit error rate; CMOS technology; Circuits; Clocks; Correlators; Frequency; Injection-locked oscillators; Phase locked loops; SONET; Voltage-controlled oscillators; Burst mode; clock and data recovery (CDR); injection-locked; operational amplifier; phase-locked loop (PLL); voltage-controlled oscillator (VCO);
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2007.916598
