DocumentCode :
1081617
Title :
Fully Integrated CMOS Power Amplifier With Efficiency Enhancement at Power Back-Off
Author :
Liu, Gang ; Haldi, Peter ; Liu, Tsu-Jae King ; Niknejad, Ali M.
Author_Institution :
Marvell Semicond., Santa Clara
Volume :
43
Issue :
3
fYear :
2008
fDate :
3/1/2008 12:00:00 AM
Firstpage :
600
Lastpage :
609
Abstract :
This paper presents a new approach for power amplifier design using deep submicron CMOS technologies. A transformer based voltage combiner is proposed to combine power generated from several low-voltage CMOS amplifiers. Unlike other voltage combining transformers, the architecture presented in this paper provides greater flexibility to access and control the individual amplifiers in a voltage combined amplifier. In this work, this voltage combining transformer has been utilized to control output power and improve average efficiency at power back-off. This technique does not degrade instantaneous efficiency at peak power and maintains voltage gain with power back-off. A 1.2 V, 2.4 GHz fully integrated CMOS power amplifier prototype was implemented with thin-oxide transistors in a 0.13 mum RF-CMOS process to demonstrate the concept. Neither off-chip components nor bondwires are used for output matching. The power amplifier transmits 24 dBm power with 25% drain efficiency at 1 dB compression point. When driven into saturation, it transmits 27 dBm peak power with 32% drain efficiency. At power back-off, efficiency is greatly improved in the prototype which employs average efficiency enhancement circuitry.
Keywords :
CMOS analogue integrated circuits; UHF integrated circuits; UHF power amplifiers; flexible electronics; integrated circuit design; potential transformers; power combiners; power control; thin film transistors; average efficiency enhancement circuitry; deep submicron CMOS technologies; drain efficiency; frequency 2.4 GHz; fully integrated CMOS power amplifier; low-voltage CMOS amplifiers; power amplifier design; power back-off stage; power control; size 0.13 mum; thin-oxide transistors; transformer based voltage combiner; voltage 1.2 V; voltage combined amplifier; Bonding; CMOS process; CMOS technology; Circuit faults; Degradation; Impedance matching; Power amplifiers; Power generation; Prototypes; Voltage control; CMOS; efficiency; integration; linearity; power amplifier;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2007.916585
Filename :
4456783
Link To Document :
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