DocumentCode :
1081671
Title :
Optimal test-times for intermittent faults
Author :
Chung, Kun-Jen
Author_Institution :
Dept. of Ind. Manage., Nat. Taiwan Univ., Taipei, Taiwan
Volume :
44
Issue :
4
fYear :
1995
fDate :
12/1/1995 12:00:00 AM
Firstpage :
645
Lastpage :
647
Abstract :
Su et al. (1978) considered continuous and repetitive tests for a continuous-parameter Markov model with intermittent faults. Periodic tests for intermittent faults are scheduled at times k·T (k=1, 2,...). This paper presents a simple algorithm to compute the optimal time to minimize the mean cost until detection when the test model is imperfect. First an upper bound is found for the optimal time. Then a bisection-algorithm is used to minimize the cost of detecting faults for a system in which faults are intermittent and unpredictable. Using this algorithm, the solution of example 1 is better than that of Nakagawa and Yasui (1989) by at least 10%. This algorithm can be more useful than the Newton-Raphson method to locate an optimum because Newton-Raphson involves the first derivative whereas the bisection method does not
Keywords :
digital systems; failure analysis; fault diagnosis; bisection-algorithm; faults detection; imperfect test models; intermittent faults; mean cost minimisation; optimal test-times; Cost function; Digital systems; Equations; Exponential distribution; Fault detection; Newton method; Nuclear magnetic resonance; Processor scheduling; System testing; Upper bound;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.475995
Filename :
475995
Link To Document :
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