Title :
VA-1 simple physical models for bulk and surface electron velocities in silicon
Author :
Schwarz, S.A. ; Russek, S.E.
fDate :
10/1/1982 12:00:00 AM
Keywords :
Circuit simulation; Computational modeling; Electrons; Impurities; MOSFET circuits; Nonlinear equations; Phonons; Silicon; Temperature; Very large scale integration;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1982.20984