DocumentCode :
1081907
Title :
Guest Editors´ Introduction: The Status of IEEE Std 1500
Author :
Marinissen, Erik Jan ; Zorian, Yervant
Author_Institution :
IMEC
Volume :
26
Issue :
1
fYear :
2009
Firstpage :
6
Lastpage :
7
Abstract :
The increased use of embedded predesigned reusable cores necessitates a core-based test strategy. The goal of IEEE Std 1500-2005 is to simplify reuse and facilitate interoperability for testing core-based system chips, especially if they contain cores from different sources. This special issue updates readers on the status of the usage and adoption of this standard.
Keywords :
Circuit testing; Electronic design automation and methodology; Hardware; Integrated circuit testing; Logic testing; Manufacturing industries; Microprocessors; Semiconductor device manufacture; Standards development; System testing; IEEE Std 1500-2005; core-based test; reusable cores; standard; system chip;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2009.10
Filename :
4760110
Link To Document :
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