DocumentCode :
1081913
Title :
VB-11 InP annealing studies
Author :
Streetman, B.G.
Volume :
29
Issue :
10
fYear :
1982
fDate :
10/1/1982 12:00:00 AM
Firstpage :
1700
Lastpage :
1701
Keywords :
Annealing; Electron traps; Fabrication; Hot carriers; Implants; Indium phosphide; Ion implantation; MOSFET circuits; Microwave devices; Pollution measurement;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1982.20996
Filename :
1482493
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1081913
