Title :
IEEE Std 1500 Enables Modular SoC Testing
Author :
Marinissen, Erik Jan ; Zorian, Yervant
Abstract :
IEEE Std 1500 enables modular SoC testing, not only for core-based testing, but also for divide-and-conquer test generation and test reuse. This article provides a brief tutorial on the standard and illustrates its usage through two application case studies.
Keywords :
IEEE standards; logic testing; system-on-chip; IEEE Std 1500; divide-and-conquer test generation; modular SoC testing; system-on-chip; test reuse; Circuit testing; Electronics industry; Libraries; Logic design; Logic testing; Manufacturing processes; Memory architecture; Random access memory; Semiconductor device manufacture; Semiconductor device testing; IEEE Std 1500; SoC; manufacturing test; modular testing; test access mechanism; wrapper;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2009.12
