• DocumentCode
    1081918
  • Title

    IEEE Std 1500 Enables Modular SoC Testing

  • Author

    Marinissen, Erik Jan ; Zorian, Yervant

  • Volume
    26
  • Issue
    1
  • fYear
    2009
  • Firstpage
    8
  • Lastpage
    17
  • Abstract
    IEEE Std 1500 enables modular SoC testing, not only for core-based testing, but also for divide-and-conquer test generation and test reuse. This article provides a brief tutorial on the standard and illustrates its usage through two application case studies.
  • Keywords
    IEEE standards; logic testing; system-on-chip; IEEE Std 1500; divide-and-conquer test generation; modular SoC testing; system-on-chip; test reuse; Circuit testing; Electronics industry; Libraries; Logic design; Logic testing; Manufacturing processes; Memory architecture; Random access memory; Semiconductor device manufacture; Semiconductor device testing; IEEE Std 1500; SoC; manufacturing test; modular testing; test access mechanism; wrapper;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2009.12
  • Filename
    4760111
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1081918