• DocumentCode
    1081929
  • Title

    Improved Core Isolation and Access for Hierarchical Embedded Test

  • Author

    Nadeau-Dostie, Benoit ; Adham, Saman M I ; Abbott, Russell

  • Author_Institution
    LogicVision, SanJose, CA
  • Volume
    26
  • Issue
    1
  • fYear
    2009
  • Firstpage
    18
  • Lastpage
    25
  • Abstract
    IEEE Std 1500 enables automation and hence allows for easier and faster integration of embedded cores into an SoC. This article describes an automated test development system based on the concept of embedded test.
  • Keywords
    automatic testing; integrated circuit testing; system-on-chip; IEEE Std 1500; SoC; automated test development system; hierarchical embedded test; improved core isolation; Assembly; Automatic testing; Built-in self-test; Circuit testing; Concurrent engineering; Design methodology; Integrated circuit testing; Logic design; Logic testing; System testing; IEEE Std 1500; TAP; WSP; core isolation; embedded test; hierarchical test; shared isolation;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2009.13
  • Filename
    4760112
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1081929