Author :
Wang, Laung-Terng ; Apte, Ravi ; Wu, Shianling ; Sheu, Boryau ; Jone, Wen-Ben ; Guo, Jianghao ; Lee, Kuen-Jong ; Wang, Wei-Shin ; Wen, Xiaoqing ; Chao, Hao-Jan ; Liu, Jinsong ; Niu, Yanlong ; Sung, Yi-Chih ; Wang, Chi-Chun ; Li, Fangfang
Keywords :
IEEE standards; electronic design automation; fault diagnosis; integrated circuit testing; DFT insertion; IC testing; IEEE Std 1500; Turbo1500; core-based design; fault diagnosis; test generation; tool support; Automatic testing; Automation; Circuit testing; Fault diagnosis; Field programmable gate arrays; Hardware; Integrated circuit interconnections; Silicon; Standards development; System testing; IEEE Std 1500; SoC testing; Turbo1500; core diagnosis; core-based testing; hierarchical testing;
