DocumentCode :
1081940
Title :
VIA-4 avalanche-induced breakdown mechanisms in short-channel MOSFETs
Author :
Hsu, F.-C. ; Ko, P.K. ; Tam, Simon ; Hu, Chuanmin ; Muller, R.S.
Volume :
29
Issue :
10
fYear :
1982
fDate :
10/1/1982 12:00:00 AM
Firstpage :
1702
Lastpage :
1703
Keywords :
Avalanche breakdown; Breakdown voltage; Electric breakdown; Electrons; Feedback; Laboratories; MOSFETs; Semiconductor process modeling; Sufficient conditions; Sun;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1982.20998
Filename :
1482495
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1081940
