DocumentCode
1081940
Title
VIA-4 avalanche-induced breakdown mechanisms in short-channel MOSFETs
Author
Hsu, F.-C. ; Ko, P.K. ; Tam, Simon ; Hu, Chuanmin ; Muller, R.S.
Volume
29
Issue
10
fYear
1982
fDate
10/1/1982 12:00:00 AM
Firstpage
1702
Lastpage
1703
Keywords
Avalanche breakdown; Breakdown voltage; Electric breakdown; Electrons; Feedback; Laboratories; MOSFETs; Semiconductor process modeling; Sufficient conditions; Sun;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1982.20998
Filename
1482495
Link To Document