Title :
CTL and Its Usage in the EDA Industry
Author :
Kapur, Rohit ; Reuter, Paul ; Bhatia, Sandeep ; Keller, Brion
Abstract :
The Core Test Language, originally developed within the IEEE 1500 development working group but later spun out as an independent standard, specifies the standardized language in which core test information for both wrapped and still-to-be-wrapped cores is described.
Keywords :
IEEE standards; computer testing; machine oriented languages; Core Test Language; EDA industry; IEEE 1500 development working group; core test information; independent standard; standardized language; still-to-be-wrapped cores; Automatic testing; Electronic design automation and methodology; Graphics; Hardware; Performance evaluation; Proposals; Standards development; System testing; ATPG; CTL; Core Test Language; EDA industry; IEEE Std 1500; test reuse; test synthesis;
Journal_Title :
Design & Test of Computers, IEEE
