Title :
Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor
Author :
Balakrishnan, Kedarnath J. ; Giles, Grady ; Wingfield, James
Abstract :
Multicore microprocessors provide a natural application environment for IEEE Std 1500 and, as this article proves, allow for innovative approaches that capitalize on the fact that the various cores are identical.
Keywords :
IEEE standards; integrated circuit testing; microprocessor chips; IEEE Std 1500; multicore microprocessors; quad-core AMD opteron microprocessor; test access mechanism; Bandwidth; Broadcasting; Circuit testing; Fault detection; Job shop scheduling; Laser mode locking; Manufacturing; Microprocessors; Multicore processing; Pins; SoC testing; embedded-core testing; microprocessor testing; quad-core AMD microprocessor; test access mechanism; test compression;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2009.17
