Title :
IEEE Std 1500 enables core-based SoC test development
Abstract :
IEEE Std 1500 supports cost-efficient testing of core-based SoCs. Several popular commercial cores have incorporated IEEE-1500-compliant wrappers, and many complex SoC designs have successfully employed a modular-testing strategy enabled by this standard. This special issue examines the usage experiences of this important standard. Also included in this issue of D&T is a Perspectives article from Intel´s Gadi Singer on emerging computing trends, challenges of nanoscale device integration, and the resulting gigascale complexity. In addition, there are three general-interest articles on various topics.
Keywords :
CMOS analog integrated circuits; CMOS logic circuits; Circuit testing; Logic design; Logic testing; Nanowires; Programmable logic arrays; Shipbuilding industry; Standards development; System testing; Gadi Singer; IEEE Std 1500; IP blocks; embedded reusable cores; gigascale complexity; modular testing;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2009.11
