DocumentCode :
1082079
Title :
Test Technology Newsletter
Volume :
26
Issue :
1
fYear :
2009
Firstpage :
1
Lastpage :
2
Abstract :
This newsletter provides information on past and upcoming events related to the IEEE Computer Society´s Test Technology Technical Council and the test community.
Keywords :
DATE; ETS; ITC; LATW; TTTC; TestWeek; VTS; test technology;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2009.18
Filename :
4760124
Link To Document :
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