DocumentCode :
1082168
Title :
Silicon-carbide microfabrication by silicon lost molding for glass-press molds
Author :
Itoh, Toru ; Tanaka, Shuji ; Li, Jing-Feng ; Watanabe, Ryuzo ; Esashi, Masayoshi
Author_Institution :
Dept. of Nanomechanics, Tohoku Univ., Sendai
Volume :
15
Issue :
4
fYear :
2006
Firstpage :
859
Lastpage :
863
Abstract :
This paper describes two silicon carbide (SiC) microfabrication processes for SiC glass-press molds. One is silicon lost molding combined with SiC chemical-vapor deposition (CVD) and SiC reaction sintering (RS). The other is silicon lost molding combined with SiC CVD and SiC solid-state reaction bonding (SSRB). In both of these processes, an original pattern on a silicon substrate is transferred to a CVD SiC film, and then the film is backed by bulk SiC to obtain rigidity and robustness against pressing force. Finally, the silicon substrate is etched away to release a SiC mold. In the process using SiC CVD and RS, an original pattern on a silicon substrate was transferred to a SiC mold, but the surface roughness of the SiC mold was 0.05-0.08 mum Ra, and worse than required by the glass-press mold. This was caused by the transformation of amorphous SiC to polycrystalline SiC in RS, which was confirmed by the X-ray diffraction (XRD) data of the CVD SiC film before and after RS. In the process using SiC CVD and SSRB, the surface of the SiC mold was smooth (0.004-0.008 mum Ra) without the crystallization of the amorphous CVD SiC film. The SiC mold was pressed to Pyrex glass to demonstrate its high-temperature strength. The Pyrex glass was deformed by the SiC mold at 850 degC without a void, and no significant deformation of the SiC mold was observed
Keywords :
CVD coatings; amorphous semiconductors; deformation; glass; moulding; pressing; semiconductor thin films; silicon compounds; sintering; surface roughness; wide band gap semiconductors; 850 C; Pyrex glass; SiC; X-ray diffraction; amorphous film; chemical vapor deposition; crystallization; deformation; glass-press molds; high-temperature strength; microfabrication processes; polycrystalline film; reaction sintering; silicon lost molding; solid-state reaction bonding; surface roughness; void; Amorphous materials; Bonding; Chemical vapor deposition; Glass; Pressing; Robustness; Semiconductor films; Silicon carbide; Solid state circuits; Substrates;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2006.872231
Filename :
1668181
Link To Document :
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