DocumentCode
108229
Title
Persistent Current Reduction in Metal-Semiconductor FETs With a ZnCoO Channel in an External Magnetic Field
Author
Kaspar, Tim ; Fiedler, J. ; Skorupa, Ilona ; Burger, Danilo ; Mucklich, A. ; Fritzsche, Martin ; Schmidt, Oliver G. ; Schmidt, Heidemarie
Author_Institution
Helmholtz-Zentrum Dresden-Rossendorf e.V., Dresden, Germany
Volume
34
Issue
10
fYear
2013
fDate
Oct. 2013
Firstpage
1271
Lastpage
1273
Abstract
Transparent metal-semiconductor field-effect transistors (MESFETs) with a ZnCoO channel have been fabricated by pulsed laser deposition on c-plane sapphire substrates at a temperature of 550°C. The paramagnetic properties have been confirmed by magnetotransport measurements on undepleted ZnCoO films without Schottky gate contacts. The Au/AgxO Schottky gate contacts were processed by optical lithography and metallization. Below 50 K, the MESFET characteristics are persistently changed from a low resistance state (LRS) to high resistance state by an external magnetic field. The MESFET can be switched back into the LRS only by heating it up to room temperature.
Keywords
Schottky gate field effect transistors; cobalt compounds; galvanomagnetic effects; gold; integrated circuit metallisation; magnetic fields; photolithography; pulsed laser deposition; silver compounds; zinc compounds; Au-AgxO; LRS; MESFET characteristics; Schottky gate contacts; ZnCoO; c-plane sapphire substrates; current reduction; external magnetic field; high resistance state; low resistance state; magnetotransport measurements; optical lithography; optical metallization; paramagnetic properties; pulsed laser deposition; temperature 293 K to 298 K; temperature 550 degC; transparent metal-semiconductor field-effect transistors; undepleted films; Gold; Logic gates; MESFETs; Magnetic semiconductors; Magnetic switching; Resistance; Zinc oxide; Bound magnetic polaron; magnetic channel; metal-semiconductor field-effect transistor (MESFET); s-d exchange;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2013.2278538
Filename
6588594
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