• DocumentCode
    108229
  • Title

    Persistent Current Reduction in Metal-Semiconductor FETs With a ZnCoO Channel in an External Magnetic Field

  • Author

    Kaspar, Tim ; Fiedler, J. ; Skorupa, Ilona ; Burger, Danilo ; Mucklich, A. ; Fritzsche, Martin ; Schmidt, Oliver G. ; Schmidt, Heidemarie

  • Author_Institution
    Helmholtz-Zentrum Dresden-Rossendorf e.V., Dresden, Germany
  • Volume
    34
  • Issue
    10
  • fYear
    2013
  • fDate
    Oct. 2013
  • Firstpage
    1271
  • Lastpage
    1273
  • Abstract
    Transparent metal-semiconductor field-effect transistors (MESFETs) with a ZnCoO channel have been fabricated by pulsed laser deposition on c-plane sapphire substrates at a temperature of 550°C. The paramagnetic properties have been confirmed by magnetotransport measurements on undepleted ZnCoO films without Schottky gate contacts. The Au/AgxO Schottky gate contacts were processed by optical lithography and metallization. Below 50 K, the MESFET characteristics are persistently changed from a low resistance state (LRS) to high resistance state by an external magnetic field. The MESFET can be switched back into the LRS only by heating it up to room temperature.
  • Keywords
    Schottky gate field effect transistors; cobalt compounds; galvanomagnetic effects; gold; integrated circuit metallisation; magnetic fields; photolithography; pulsed laser deposition; silver compounds; zinc compounds; Au-AgxO; LRS; MESFET characteristics; Schottky gate contacts; ZnCoO; c-plane sapphire substrates; current reduction; external magnetic field; high resistance state; low resistance state; magnetotransport measurements; optical lithography; optical metallization; paramagnetic properties; pulsed laser deposition; temperature 293 K to 298 K; temperature 550 degC; transparent metal-semiconductor field-effect transistors; undepleted films; Gold; Logic gates; MESFETs; Magnetic semiconductors; Magnetic switching; Resistance; Zinc oxide; Bound magnetic polaron; magnetic channel; metal-semiconductor field-effect transistor (MESFET); s-d exchange;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2013.2278538
  • Filename
    6588594