DocumentCode
1082640
Title
The electron velocity-field characteristic for n-In0.53 Ga0.47 As at 300 K
Author
Windhorn, T.H. ; Cook, L.W. ; Stillman, G.E.
Author_Institution
University of Illinois at Urbana-Champaign, Urbana, IL
Volume
3
Issue
1
fYear
1982
fDate
1/1/1982 12:00:00 AM
Firstpage
18
Lastpage
20
Abstract
Electron drift velocities in n-type In0.53 Ga0.47 As have been measured at 300 K using a microwave time-of-flight technique at electric field strengths from about 10 kV/cm to 104 kV/cm. The electron velocity-field characteristic for n-type In0.53 Ga0.47 As exhibits a larger negative differential mobility and a lower high field velocity than is obtained with GaAs.
Keywords
Electric variables measurement; Electron mobility; Gallium arsenide; Indium phosphide; Microwave measurements; Microwave theory and techniques; Ohmic contacts; Substrates; Temperature; Velocity measurement;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1982.25459
Filename
1482564
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