Title :
Time-Wavelength Reflectance Maps of Photonic Crystal Waveguides: A New View on Disorder-Induced Scattering
Author :
Parini, Alberto ; Hamel, Philippe ; De Rossi, Alfredo ; Combrié, Sylvain ; Tran, Nguyen-Vi-Quynh ; Gottesman, Yaneck ; Gabet, Renaud ; Talneau, Anne ; Jaouën, Yves ; Vadalà, Giovanni
Author_Institution :
TELECOM SudParis, Evry, France
Abstract :
We investigate the impact of disorder on the propagation of photonic crystal waveguide modes using phase-sensitive optical low-coherence reflectometry.Combined with a suitable numerical processing, this technique reveals a considerable amount of information that we cast as time-wavelength reflectance maps. By comparing measurements on different samples, we easily identify inter-mode scattering and propagation losses mediated by slow leaky modes. We also characterize the dispersive behaviour of point defects. Our results verify previous theoretical predictions about the general group velocity scaling of losses and the dominant role of backscattering.
Keywords :
backscatter; light scattering; optical dispersion; optical losses; optical materials; optical testing; optical waveguides; photonic crystals; point defects; reflectometry; backscattering; disorder-induced scattering; group velocity dispersion; group velocity scaling; optical inter-mode scattering; phase-sensitive optical low-coherence reflectometry; photonic crystal waveguide modes; point defects; propagation losses; slow leaky modes; time-wavelength reflectance map; Dispersion; Electromagnetic scattering; Loss measurement; Optical propagation; Optical scattering; Optical waveguides; Particle scattering; Photonic crystals; Propagation losses; Reflectivity; Disorder; optical low-coherence reflectometry (OLCR); photonic crystal; slow light;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2008.2004957