Title :
Experimental confirmation of chaos in a current-programmed Cuk converter
Author :
Tse, C.K. ; Fung, S.C. ; Kwan, M.W.
Author_Institution :
Dept. of Electron. Eng., Hong Kong Polytech. Univ., Hong Kong
fDate :
7/1/1996 12:00:00 AM
Abstract :
The authors present experimental evidence for the chaotic behavior in a fourth-order Cuk converter under current-programmed control which has been studied and simulated previously by C.K. Tse and W.C.Y. Chan (see Int. J. Circuit Theor. Appl., vol. 23, no. 3, p. 217-25, May/June 1995)
Keywords :
DC-DC power convertors; bifurcation; chaos; circuit stability; programmed control; DC-DC convertor; chaos; chaotic behavior; current-programmed Cuk converter; current-programmed control; fourth-order Cuk converter; Cellular neural networks; Chaos; Circuit simulation; Inductance; MOSFET circuits; Neural networks; Oscillators; Switches; Switching converters; Voltage;
Journal_Title :
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
