Title :
Exploring Malicious Meter Inspection in Neighborhood Area Smart Grids
Author :
Zhifeng Xiao ; Yang Xiao ; Du, D.H.
Author_Institution :
Dept. of Comput. Sci., Univ. of Alabama, Tuscaloosa, AL, USA
Abstract :
In smart grids, smart meters may potentially be attacked or compromised to cause certain security risks. It is challenging to identify malicious meters when there are a large number of users. In this paper, we explore the malicious meter inspection (MMI) problem in neighborhood area smart grids. We propose a suite of inspection algorithms in a progressive manner. First, we present a basic scanning method, which takes linear time to accomplish inspection. The scanning method is efficient when the malicious meter ratio is high. Then, we propose a binary-tree-based inspection algorithm, which performs better than scanning when the malicious meter ratio is low. Finally, we employ an adaptive-tree-based algorithm, which leverages advantages of both the scanning and binary-tree inspections. Our approaches are tailored to fit both static and dynamic situations. The theoretical and experimental results have shown the effectiveness of the adaptive tree approach.
Keywords :
inspection; power system security; smart meters; smart power grids; trees (mathematics); MMI problem; adaptive tree-based algorithm; basic scanning method; binary tree-based inspection algorithm; inspection algorithm; linear time; malicious meter inspection problem; malicious meter ratio; neighborhood area smart grids; security risks; smart meters; Binary trees; Buildings; Heuristic algorithms; Inspection; Meter reading; Smart grids; Testing; Accountability; advanced metering infrastructure (AMI); attack; malicious meter inspection; security; smart grid; smart meter;
Journal_Title :
Smart Grid, IEEE Transactions on
DOI :
10.1109/TSG.2012.2229397