Title :
Multicluster tools scheduling: an integrated event graph and network model approach
Author :
Ding, Shengwei ; Yi, Jingang ; Zhang, Mike Tao
Author_Institution :
Dept. of Ind. Eng. & Oper. Res., California Univ., Berkeley, CA
Abstract :
Steady-state throughput and scheduling of a multicluster tool become complex as the number of modules and clusters grows. We propose a new methodology integrating event graph and network models to study the scheduling and throughput of multicluster tools. A symbolic decision-move-done graph modeling is developed to simplify discrete-event dynamics for the multicluster tool. This event graph is further used for searching feasible action sequences of the cluster tool. By representing sequences with networks, an extended critical path method is applied to calculate the corresponding cycle time. Grouping methods that are based on network are also introduced to reduce the searching complexity. Compared with optimization-based scheduling approaches, the proposed methodology can directly capture the cyclic characteristic of cluster tool schedules and be applied to analyze the impact of process and wafer flow variations on cycle time and robot schedules. We have successfully applied this new methodology to dozens of cluster tools at Intel Corporation. A chemical-mechanical planarization polisher is employed as an example to illustrate and validate the proposed methodology
Keywords :
chemical mechanical polishing; cluster tools; discrete event systems; graphs; robot dynamics; single machine scheduling; chemical-mechanical planarization polisher; cluster tool schedules; cycle time; cyclic characteristic; decision-move-done graph; discrete-event dynamics; extended critical path; grouping methods; integrated event graph; multicluster tools scheduling; network model approach; process variations; robot schedules; searching complexity; semiconductor manufacturing; steady-state throughput; wafer flow variations; Industrial engineering; Job shop scheduling; Optimal scheduling; Planarization; Production; Robot kinematics; Semiconductor device manufacture; Service robots; Steady-state; Throughput; Cluster tool; event graph; network; scheduling; semiconductor manufacturing;
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
DOI :
10.1109/TSM.2006.879414