Title :
Junction field-effect transistors using In0.53Ga0.47As material grown by molecular beam epitaxy
Author :
Chang, T.Y. ; Leheny, R.F. ; Nahory, R.E. ; Silberg, E. ; Ballman, A.A. ; Caridi, E.A. ; Harrold, C.J.
Author_Institution :
Bell Laboratories Inc., Holmdel, NJ
fDate :
3/1/1982 12:00:00 AM
Abstract :
In this article we discusss the fabrication of junction field-effect transistors (JFETs) using In0.53Ga0.47As grown p-n junction material prepared by molecular beam epitaxy (MBE). For an n-channel doping of 2 × 1016cm-3and a gate length of 2.0µm, these devices are shown to have a transconductance of 50 mS/mm with a corresponding internal transconductance of 67 mS/mm.
Keywords :
Etching; FETs; Indium phosphide; JFETs; Lattices; Leakage current; Molecular beam epitaxial growth; P-n junctions; Substrates; Transconductance;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1982.25477