Title : 
Junction field-effect transistors using In0.53Ga0.47As material grown by molecular beam epitaxy
         
        
            Author : 
Chang, T.Y. ; Leheny, R.F. ; Nahory, R.E. ; Silberg, E. ; Ballman, A.A. ; Caridi, E.A. ; Harrold, C.J.
         
        
            Author_Institution : 
Bell Laboratories Inc., Holmdel, NJ
         
        
        
        
        
            fDate : 
3/1/1982 12:00:00 AM
         
        
        
        
            Abstract : 
In this article we discusss the fabrication of junction field-effect transistors (JFETs) using In0.53Ga0.47As grown p-n junction material prepared by molecular beam epitaxy (MBE). For an n-channel doping of 2 × 1016cm-3and a gate length of 2.0µm, these devices are shown to have a transconductance of 50 mS/mm with a corresponding internal transconductance of 67 mS/mm.
         
        
            Keywords : 
Etching; FETs; Indium phosphide; JFETs; Lattices; Leakage current; Molecular beam epitaxial growth; P-n junctions; Substrates; Transconductance;
         
        
        
            Journal_Title : 
Electron Device Letters, IEEE
         
        
        
        
        
            DOI : 
10.1109/EDL.1982.25477