Title :
An automated microwave measurements experience for undergraduates
Author :
Mulholland, John E. ; Noble, Sean Patrick
Author_Institution :
Dept. of Electr. Eng., Villanova Univ., PA, USA
fDate :
5/1/1994 12:00:00 AM
Abstract :
Experiments in microwave measurements for an undergraduate laboratory course are described that bridge the gap between point-by-point manual measurements and automatic network analyzer measurements. In the sequence of 10 laboratory experiments, the basic parameters of frequency versus wavelength in a waveguide are explored, first in point-by-point measurements versus frequency. Swept frequency measurements are taken up next in the form of an open-ended design experiment investigating a simple two-pole band pass filter. Following this, scalar transmission and reflection measurements are made using a PC as a controller and data-acquisition unit. Lastly, the Hewlett-Packard 8510B Automatic Network Analyzer is used by the students to perform the measurements on the same device as a verification of the earlier results. This paper concentrates on the design of the computer-aided measurements experiment, describing the requirements for the experimental content as well as the peripheral content, such as the controller language (HP BASIC) and the interface (HPIB-HP Interface Bus)
Keywords :
computerised instrumentation; demonstrations; microcomputer applications; microwave measurement; student laboratory apparatus; swept-frequency reflectometry; waveguides; HP BASIC; HPIB-HP Interface Bus; Hewlett-Packard 8510B Automatic Network Analyzer; PC; automated microwave measurements; computer-aided measurements experiment; controller; controller language; data-acquisition unit; point-by-point measurements; reflection measurements; scalar transmission measurements; swept frequency measurements; two-pole band pass filter; undergraduate laboratory course; waveguide; Automatic control; Band pass filters; Bridges; Frequency measurement; Laboratories; Microwave measurements; Performance analysis; Performance evaluation; Reflection; Wavelength measurement;
Journal_Title :
Education, IEEE Transactions on