• DocumentCode
    1082894
  • Title

    A 70 mΩ intelligent high side switch with full diagnostics

  • Author

    Gariboldi, Roberto ; Pulvirenti, Francesco

  • Author_Institution
    SGS-Thomson Microelectron., Milan, Italy
  • Volume
    31
  • Issue
    7
  • fYear
    1996
  • fDate
    7/1/1996 12:00:00 AM
  • Firstpage
    915
  • Lastpage
    923
  • Abstract
    A new, smart power switch for industrial, automotive, and computer applications developed in BCD (Bipolar, CMOS, DMOS) technology is described. It consists of an on-chip 70 mΩ power DMOS transistor connected in high side configuration and its driver makes the device virtually indestructible and suitable to drive any kind of load with an output current of 2.5 A. If the load is inductive, an internal voltage clamp allows fast demagnetization down to 55 V below the supply voltage. The device includes novel structures for the driver, the fully integrated charge pump circuit, and its oscillator. These circuits have specifically been designed to reduce electromagnetic interference (EMI) thanks to an accurate control of the output voltage slope and the reduction of the output voltage ripple caused by the charge pump itself. An innovative open load circuit allows the detection of the open load condition with high precision (3 mA ±10% within the temperature range from -25 to 150°C and including process spreads). Furthermore, the device protects the load from ground disconnection and is compatible with the new IEC standards concerning burst and surge tests. The quiescent current has also been reduced to 600 μA. Diagnostics for CPU feedback is externally available from the chip by two dedicated pins when the following fault conditions occur: open load, overload and short circuit to ground or to the supply voltage, overtemperature, and undervoltage supply
  • Keywords
    power integrated circuits; semiconductor switches; -25 to 150 C; 70 mohm; BCD technology; CPU feedback; burst tests; charge pump circuit; diagnostics; driver; electromagnetic interference; ground disconnection; intelligent high side switch; open load circuit; oscillator; power DMOS transistor; quiescent current; smart power IC; surge tests; Automotive engineering; CMOS technology; Charge pumps; Clamps; Computer applications; Computer industry; Driver circuits; Electromagnetic interference; Switches; Voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.508203
  • Filename
    508203