Title :
A Recovery Algorithm for Frequency-Domain Layered Finite Element Analysis of Large-Scale High-Frequency Integrated Circuits
Author_Institution :
Purdue Univ., West Lafayette
Abstract :
A recovery algorithm is proposed for the frequency-domain layered finite element analysis of large-scale high-frequency integrated circuits. Given the solution in one layer, this algorithm can recover the solutions in other layers with single-layer computational complexity. Numerical and experimental results are given to demonstrate its validity.
Keywords :
computational complexity; finite element analysis; frequency-domain analysis; integrated circuit design; large scale integration; frequency-domain layered finite element analysis; large-scale high-frequency integrated circuits; recovery algorithm; single-layer computational complexity; Algorithm design and analysis; Computational complexity; Digital integrated circuits; Finite element methods; Frequency domain analysis; Integrated circuit modeling; Large scale integration; Large-scale systems; Radio frequency; Radiofrequency integrated circuits; Finite element method (FEM); high frequency; integrated circuits (ICs);
Journal_Title :
Microwave and Wireless Components Letters, IEEE
DOI :
10.1109/LMWC.2007.901752
