Title :
A novel camel diode gate GaAs FET
Author :
Kopp, W. ; Drummond, T.J. ; Wang, T. ; Morkoc, H. ; Su, S.L.
Author_Institution :
University of Illinois, Urbana, IL
fDate :
4/1/1982 12:00:00 AM
Abstract :
A novel device utilizing the "camel diode" in place of a Schottky barrier gate has been demonstrated in GaAs grown by molecular beam epitaxy (MBE). The devices have a 7.5 µm channel length, 3 µm gate length, and a 280 µm gate width. The layers from which the devices are fabricated consist of a 0.15 µm GaAs layer doped to a level of 1.5 × 1017cm-3to form the channel, and a 100 Å p+GaAs and a 400 Å n+ region to form the gate. Because of the long gate length, the electron velocity does not reach saturation, thus a transconductance of 80 mS/mm is obtained. A simple theory describing the device operation has also been developed.
Keywords :
Epitaxial growth; Etching; FETs; Gallium arsenide; Molecular beam epitaxial growth; Schottky barriers; Schottky diodes; Semiconductor diodes; Substrates; Temperature;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1982.25489