• DocumentCode
    1083056
  • Title

    Optimal tower fields

  • Author

    Baktir, Selçuk ; Sunar, Berk

  • Author_Institution
    Electr. & Comput. Eng. Dept., Worcester Polytech. Inst., MA, USA
  • Volume
    53
  • Issue
    10
  • fYear
    2004
  • Firstpage
    1231
  • Lastpage
    1243
  • Abstract
    We introduce a new tower field representation, optimal tower fields (OTFs), that facilitates efficient finite field operations. The recursive direct inversion method we present has significantly lower complexity than the known best method for inversion in optimal extension fields (OEFs), i.e., Itoh-Tsujii´s inversion technique. The complexity of our inversion algorithm is shown to be O(m2), significantly better than that of the Itoh-Tsujii algorithm, i.e., O(m2(log2m.)). This complexity is further improved to O(mlog23) by utilizing the Karatsuba-Ofman algorithm. In addition, we show that OTFs may be converted to OEF representation via a simple permutation of the coefficients and, hence, OTF operations may be utilized to achieve the OEF arithmetic operations whenever a corresponding OTF representation exists. While the original OTF multiplication and squaring operations require slightly more additions than their OEF counterparts, due to the free conversion, both OTF operations may be achieved with the complexity of OEF operations.
  • Keywords
    Galois fields; computational complexity; cryptography; Itoh-Tsujii´s inversion technique; Karatsuba-Ofman algorithm; OEF arithmetic operation; OTF operation; elliptic curve cryptography; finite field operation; lower complexity; optimal tower fields; recursive direct inversion method; Arithmetic; Digital signatures; Elliptic curve cryptography; Elliptic curves; Embedded computing; Embedded system; Galois fields; Poles and towers; Polynomials; Public key; 65; Index Terms- Optimal tower fields; OEF; elliptic curve cryptography.; finite fields; inversion; multiplication;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.2004.83
  • Filename
    1327575