Title :
High temperature superconducting space-qualified multiplexers and delay lines
Author :
Talisa, Salvador H. ; Janocko, Michael A. ; Meier, D.L. ; Talvacchio, John ; Moskowitz, C. ; Buck, D.C. ; Nye, R.S. ; Pieseski, S.J. ; Wagner, George R.
Author_Institution :
Sci. & Technol. Center, Northrop Grumman Corp., Pittsburgh, PA, USA
fDate :
7/1/1996 12:00:00 AM
Abstract :
A high temperature superconducting (HTS) four-channel multiplexer and a delay line were fabricated, space qualified and tested as part of the U.S. Navy´s High Temperature Superconductivity Space Experiment II (HTSSE-II). The multiplexer had an architecture that included two branch-line hybrids and two identical parallel-coupled line filters per channel. Its operation was centered at 4 GHz, with 50-MHz-wide channels. It was fully integrated, with microstrip interconnections between channels and thin-film load terminations in the out-of-phase port of the output hybrid. The delay line was made up of two cascaded modules for a total delay of 45 ns between 2 and 6 GHz. Both devices were made using 5-cm-diameter LaAlO3 wafers coated with epitaxial thin film YBa2 Cu3O7, on both sides in the case of the delay line. Both devices operated at 77 K
Keywords :
barium compounds; delay lines; high-temperature superconductors; microstrip lines; multiplexing equipment; space vehicle electronics; superconducting epitaxial layers; superconducting microwave devices; superconducting thin films; yttrium compounds; 2 to 6 GHz; 45 ns; 77 K; HTSSE-II; High Temperature Superconductivity Space Experiment II; LaAlO3; YBa2Cu3O7-LaAlO3; branch-line hybrids; cascaded modules; epitaxial thin film; high temperature superconductors; microstrip interconnections; out-of-phase port; parallel-coupled line filters; space-qualified delay lines; space-qualified multiplexers; thin-film load terminations; total delay; Delay lines; High temperature superconductors; Microstrip; Multiplexing; Superconducting epitaxial layers; Superconducting filters; Superconducting thin films; Superconductivity; Testing; Thin film devices;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
